Repeatability of image quality in very low‐field MRI

Author:

Poojar Pavan1ORCID,Oiye Ivan Etoku2,Aggarwal Kunal3,Jimeno Marina Manso4ORCID,Vaughan John Thomas4,Geethanath Sairam2

Affiliation:

1. Addiction Institute of Mount Sinai, Department of Psychiatry Icahn School of Medicine at Mount Sinai New York New York USA

2. Accessible Magnetic Resonance Laboratory, The Russell H. Morgan Department of Radiology and Radiological Science Johns Hopkins School of Medicine Baltimore Maryland USA

3. Biomedical Imaging and Engineering Institute, Department of Diagnostic, Molecular and Interventional Radiology Icahn School of Medicine at Mount Sinai New York New York USA

4. Columbia Magnetic Resonance Research Center Columbia University New York New York USA

Abstract

BackgroundVery low‐field MR has emerged as a promising complementary device to high‐field MRI scanners, offering several advantages. One of the key benefits is that very low‐field scanners are generally more portable and affordable to purchase and maintain, making them an attractive option for medical facilities looking to reduce costs. Very low‐field MRI systems also have lower RF power deposition, making them safer and less likely to cause tissue heating or other safety concerns. They are also simpler to maintain, as they do not require cooling agents such as liquid helium. However, these portable MR scanners are impacted by temperature, lower magnetic field strength, and inhomogeneity, resulting in images with lower signal‐to‐noise ratio (SNR) and higher geometric distortions. It is essential to investigate and tabulate the variations in these parameters to establish bounds so that subsequent in vivo studies and deployment of these portable systems can be well informed.PurposeThe aim of this work is to investigate the repeatability of image quality metrics such as SNR and geometrical distortion at 0.05 T over 10 days and three sessions per day.MethodsWe acquired repeatability data over 10 days with three sessions per day. The measurements included temperature, humidity, transmit frequency, off‐resonance maps, and 3D turbo spin echo (TSE) images of an in vitro phantom. This resulted in a protocol with 11 sequences. We also acquired a 3 T data set for reference. The image quality metrics included computing SNR and eccentricity (to assess geometrical distortion) to investigate the repeatability of 0.05 T image quality. The image reconstruction included drift correction, k‐space filtering, and off‐resonance correction. We computed the experimental parameters' coefficient of variation (CV) and the resulting image quality metrics to assess repeatability. We have explored the impact of electromagnetic interference (EMI) on image quality in very low‐field MRI. The investigation involved varying both the distance and amplitude of the EMI‐producing coil from the signal generator to analyze their effects on image quality.ResultsThe range of temperature measured during the study was within 1.5 °C. The off‐resonance maps acquired before and after the 3D TSE showed similar hotspots and were changed mainly by a global constant. The SNR measurements were highly repeatable across sessions and over the 10 days, quantified by a CV of 6.7%. The magnetic field inhomogeneity effects quantified by eccentricity showed a CV of 13.7%, but less than 5.1% in two of the three sessions over 10 days. The use of conjugate phase reconstruction mitigated geometrical distortion artifacts. Temperature and humidity did not significantly affect SNR or mean frequency drift within the ranges of these environmental factors investigated. The EMI experiment showed that as the amplitude increased the SNR decreased, and concurrently the root mean square of the background increased with a rise in EMI amplitude or a reduction in distance.ConclusionsWe found that humidity and temperature in the range investigated did not impact SNR or frequency. Based on the CV values computed session‐wise and for the overall study, our findings indicate high repeatability for SNR and magnetic field homogeneity.

Funder

Rensselaer Polytechnic Institute

Publisher

Wiley

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