The conversion of a field-emission scanning electron microscope to a high-resolution, high-performance scanning transmission electron microscope, while maintaining original functions-Reference-Cited by-同舟云学术

The conversion of a field-emission scanning electron microscope to a high-resolution, high-performance scanning transmission electron microscope, while maintaining original functions

Published:1987-05 Issue:1 Volume:6 Page:15-30
ISSN:0741-0581
Container-title:Journal of Electron Microscopy Technique
language:en
Short-container-title:J. Elec. Microsc. Tech.

Author:

Oho Eisaku,Baba Misuzu,Baba Norio,Muranaka Yoshinori,Sasaki Toshihide,Adachi Koichi,Osumi Masako,Kanaya Koichi

Publisher

Wiley

Subject

Anatomy

Reference37 articles.

1. and (1974) Principles and practice of electron microscope operation. In (ed.): Practical Methods in Electron Microscopy. Amsterdam: North-Holland Publishing Company, Vol. 2, pp. 320-328.

2. and (1975) The optimization of STEM contrast for thick specimens. In (ed.): Proc. 8th Annu. SEM Symp. Chicago: IIT Research Institute, Vol. 1, pp. 71-78.

3. Imaging in scanning microscopes

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