An inexpensive and highly efficient device for observing a transmitted electron image in SEM-Reference-Cited by-同舟云学术

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An inexpensive and highly efficient device for observing a transmitted electron image in SEM

Published:1987-01 Issue:1 Volume:5 Page:51-58
ISSN:0741-0581
Container-title:Journal of Electron Microscopy Technique
language:en
Short-container-title:J. Elec. Microsc. Tech.

Author:

Oho Eisaku,Sasaki Toshihide,Adachi Koichi,Muranaka Yoshinori,Kanaya Koichi

Publisher

Wiley

Subject

Anatomy

Reference15 articles.

1. A simple transmission stage using the standard collection system in the scanning electron microscope

2. and (1982) Interaction of electron beam with the target in scanning electron microscope. In: Electron Beam Interactions With Solids. and eds.: SEM. Inc., Chicago, pp. 69-98.

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Acceptance Angle Control for Improved Transmission Imaging in an SEM;Microscopy Today;2017-03

2. Bright field and dark field STEM-IN-SEM imaging of polymer systems;Journal of Applied Polymer Science;2014-05-15

3. An Inexpensive Approach for Bright-Field and Dark-Field Imaging by Scanning Transmission Electron Microscopy in Scanning Electron Microscopy;Microscopy and Microanalysis;2014-01-15

4. TSEM;Advances in Imaging and Electron Physics;2012

5. Contrast in the transmission mode of a low-voltage scanning electron microscope;Journal of Microscopy;1994-03

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