Author:
Apkarian Robert P.,Gutekunst Marc D.,Joy David C.
Reference13 articles.
1. Conditions required for detection of specimen-specific SE-I secondary electrons in an analytical SEM
2. and (1988) Analysis of metal films suitable for high resolution SE-I microscopy. Microbeam Anal., 459-462.
Cited by
18 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献