Real time computer simulation of electron microscope images with tilted illumination: Grain boundary applications-Reference-Cited by-同舟云学术

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Real time computer simulation of electron microscope images with tilted illumination: Grain boundary applications

Published:1991-11 Issue:3 Volume:19 Page:366-378
ISSN:0741-0581
Container-title:Journal of Electron Microscopy Technique
language:en
Short-container-title:J. Elec. Microsc. Tech.

Author:

Krakow W.

Publisher

Wiley

Subject

Anatomy

Reference22 articles.

1. Atomic structure of [011] and [001] near-coincident tilt boundaries in germanium and silicon

2. Identification of Grain Boundary Atomic Structure in Gold by Matching Lattice Imaging Micrographs with Simulated Images

3. Proceedings o;Komoda,1966

4. Applications of electronically controlled illumination in the conventional transmission electron microscope

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Molecular dynamics simulation of fracture behaviors of 〈110〈 tilt grain boundaries in γ-TiAl;Transactions of Nonferrous Metals Society of China;2014-11

2. An atomic model of AlCuFe, and its comparison with high-resolution electron microscope images;Journal of Non-Crystalline Solids;1993-02

3. High resolution electron microscopy of Al–Cu–Fe quasicrystals: Atomic structure and modeling;Journal of Materials Research;1993-01

4. Sideband holographic imaging of a tilt grain boundary to the 1.22 Å resolution level;Ultramicroscopy;1992-11

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