Modeling the impact of fundamental and quantum resistance on the performance of SWCNT‐based RLC interconnects-Reference-Cited by-同舟云学术

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Modeling the impact of fundamental and quantum resistance on the performance of SWCNT‐based RLC interconnects

Published:2019-11-06 Issue:1 Volume:33 Page:
ISSN:0894-3370
Container-title:International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
language:en
Short-container-title:Int J Numer Model

Author:

Jadav Sunil¹^ORCID,Chandel Rajeevan²,Vashishath Munish¹

Affiliation:

1. Electronics Engineering DepartmentYMCA University of Science and Technology Faridabad India

2. Electronics and Communication Engineering DepartmentNational Institute of Technology Hamirpur Hamirpur India

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Science Applications,Modeling and Simulation

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jnm.2698

Reference31 articles.

1. An RLC interconnect model based on Fourier analysis;Chen;IEEE Trans. Comput.-Aided Design Integr. Circuits Syst.,2005

2. Modeling of distributed RLC interconnect and transmission line via closed forms and recursive algorithms;Wang;IEEE Trans VLSI Syst,2010

3. Effects of inductance on the propagation delay and repeater insertion in VLSI circuits;Ismail;IEEE Circ Syst Mag.,2003

4. On-chip inductance cons and pros;Ismail;IEEE Trans VLSI Syst,2002

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