ChemInform Abstract: Experimental Methods for Investigating the Defect Properties of SiO2 in Metal Oxide Semiconductor Transistors
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Published:2010-06-18
Issue:47
Volume:29
Page:no-no
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ISSN:0931-7597
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Container-title:ChemInform
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language:en
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Short-container-title:ChemInform
Author:
WEBER W.,THEWES R.