X-Ray Emission Spectroscopy of the Electronic States in Pb1−xHgxS Thin Films-Reference-Cited by-同舟云学术

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X-Ray Emission Spectroscopy of the Electronic States in Pb1−xHgxS Thin Films

Published:1989-05-01 Issue:1 Volume:153 Page:153-160
ISSN:0370-1972
Container-title:physica status solidi (b)
language:de
Short-container-title:phys. stat. sol. (b)

Author:

Acharya B. S.,Singh S. K.,Nayak B. B.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Systematic structures in the K emission bands of the 3d metals

2. and , Advances in X-Ray Spectroscopy, Ed. and , Pergamon Press, 1983 (p. 36).

3. Electronic structure of amorphous si1 − xgex:h alloys studied by soft x-ray and photoelectron spectroscopies

4. Electronic structure of amorphous hydrogenated silicon by soft x-ray spectroscopy

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Vacancy-induced electronic states in substoichiometric V2 −x Mo x O3 ±y thin films and powders—A soft X-ray emission study;Bulletin of Materials Science;1999-10

2. Electronic structure and L X-ray emission spectra of molybdenum carbide, boride, nitride, silicide and silicocarbide;X-Ray Spectrometry;1994-09

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