X-Ray Spectroscopic Investigation of the Electronic Structure and Chemical Bond of the Semiconductors Sn2P2S6 and Tl3PS4-Reference-Cited by-同舟云学术

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X-Ray Spectroscopic Investigation of the Electronic Structure and Chemical Bond of the Semiconductors Sn2P2S6 and Tl3PS4

Published:1985-10-01 Issue:2 Volume:131 Page:K139-K143
ISSN:0370-1972
Container-title:physica status solidi (b)
language:de
Short-container-title:phys. stat. sol. (b)

Author:

Gusatinskii A. N.,Lavrentev A. A.,Blokhin M. A.,Slivka V. Yu.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. , et al., Complex Chalcogenides and Chalcohalogenides, Vishcha Shkola, Lvov 1983 (in Russian).

2. and , Theoretical Inorganic Chemistry, Reinhold Book Co., New York/Amsterdam/London 1976.

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantum-mechanical calculations for the electron structure of phosphorus-containing sulfides Sn2P2S6 and Tl3PS4;Bulletin of the Russian Academy of Sciences: Physics;2015-06

2. Electronic structure and chemical bonding of phosphorus-contained sulfides InPS4, TI3PS4, and Sn2P2S6;Journal of Physics and Chemistry of Solids;2003-12

3. Electronic structure ofSn2P2S6;Physical Review B;2003-03-03

4. An X-ray photoemission spectroscopy study of theSn 2 P 2 S 6 monoclinicII phase;Il Nuovo Cimento D;1998-07

5. Bibliography of ferroelectrics;Ferroelectrics;1988-01

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