A Scanning Electron Diffraction Study of Vapor-Deposited and Ion Implanted Thin Films of Ge (II)
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference15 articles.
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3. Coherent Scattering in a Random-Network Model for Amorphous Solids
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1. Electron-Microscope Studies of Glass Structure;Advances in Structural Analysis;1990
2. Electron diffraction studies of the Cd47As53 and Zn43P57 amorphous films;Journal of Non-Crystalline Solids;1987-04
3. Influence of substrate temperature on the electrical and optical properties of amorphous germanium films;Bulletin of Materials Science;1987-03
4. Chemical bonding in amorphous semiconductors;Solar Energy Materials;1982-11
5. Ion‐beam‐induced metastable Pt2Si3phase. III. Structure and diffusion in amorphous Pt2Si3;Journal of Applied Physics;1982-10
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