Nanostructural Analysis of Porous Oblique Angle Deposited (OAD) Multilayer Systems by Grazing-Incidence Small-Angle X-Ray Scattering-Reference-Cited by-同舟云学术

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Nanostructural Analysis of Porous Oblique Angle Deposited (OAD) Multilayer Systems by Grazing-Incidence Small-Angle X-Ray Scattering

Published:2018-06-20 Issue:18 Volume:5 Page:1800530
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv. Mater. Interfaces

Author:

Oliva-Ramírez Manuel¹,López-Santos Carmen¹^ORCID,Yubero Francisco¹,González-Elipe Agustín R.¹

Affiliation:

1. Institute of Materials Science of Seville (CSIC); Américo Vespucio 49 41092 Seville Spain

Funder

European Regional Development Fund

Ministerio de Economía y Competitividad

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/admi.201800530/fullpdf

Reference35 articles.

1. Perspectives on oblique angle deposition of thin films: From fundamentals to devices

2. The Thermal Oxidation of TiAlN High Power Pulsed Magnetron Sputtering Hard Coatings as Revealed by Combined Ion and Electron Spectroscopy

3. Surface Engineering of Nanostructured ZnO Surfaces

4. Glancing angle deposition: Fabrication, properties, and applications of micro- and nanostructured thin films

5. Optofluidic Modulation of Self-Associated Nanostructural Units Forming Planar Bragg Microcavities

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4. Effect of the period of the substrate oscillation in the dynamic glancing angle deposition technique: A columnar periodic nanostructure formation;Surface and Coatings Technology;2020-02

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