Local Probing of Ferroelectric and Ferroelastic Switching through Stress-Mediated Piezoelectric Spectroscopy-Reference-Cited by-同舟云学术

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Local Probing of Ferroelectric and Ferroelastic Switching through Stress-Mediated Piezoelectric Spectroscopy

Published:2016-01-19 Issue:7 Volume:3 Page:1500470
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv. Mater. Interfaces

Author:

Edwards David¹,Brewer Steven²,Cao Ye³,Jesse Stephen³,Chen Long-Qing⁴,Kalinin Sergei V.³,Kumar Amit¹,Bassiri-Gharb Nazanin²

Affiliation:

1. School of Mathematics and Physics; Queen's University Belfast; Belfast BT7 1NN UK

2. The George W. Woodruff School of Mechanical Engineering; Georgia Institute of Technology; Atlanta GA 30332-0405 USA

3. Center for Nanophase Materials Sciences; Oak Ridge National Laboratory; Oak Ridge TN 37831 USA

4. Department of Materials Science and Engineering; The Pennsylvania State University; University Park PA 16802 USA

Funder

US National Science Foundation

Department of Education and Learning

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/admi.201500470/fullpdf

Reference51 articles.

1. Emerging Non-Volatile Memories

2. Strain dependence of polarization and piezoelectric response in epitaxial BiFeO3thin films

3. Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. I. Theory

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