Nanomechanical Properties of Epitaxial Silicene Revealed by Noncontact Atomic Force Microscopy-Reference-Cited by-同舟云学术

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Nanomechanical Properties of Epitaxial Silicene Revealed by Noncontact Atomic Force Microscopy

Published:2018-11-25 Issue:2 Volume:6 Page:1801278
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv. Mater. Interfaces

Author:

Nogami Makoto¹,Fleurence Antoine¹^ORCID,Yamada-Takamura Yukiko¹,Tomitori Masahiko¹

Affiliation:

1. School of Materials Science; Japan Advanced Institute of Science and Technology; Nomi Ishikawa 923-1292 Japan

Funder

Japan Society for the Promotion of Science

Shibuya Science Culture and Sports Foundation

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/admi.201801278/fullpdf

Reference42 articles.

1. Silicene field-effect transistors operating at room temperature

2. Two- and One-Dimensional Honeycomb Structures of Silicon and Germanium

3. Theoretical possibility of stage corrugation in Si and Ge analogs of graphite

4. Electronic structure of silicon-based nanostructures

5. Measurement of the Elastic Properties and Intrinsic Strength of Monolayer Graphene

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Adatom-induced dislocation annihilation in epitaxial silicene;2D Materials;2021-08-06

2. Band engineering in an epitaxial two-dimensional honeycomb Si6−xGex alloy;Physical Review Materials;2021-01-21

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