Local Dielectric Breakdown Path along c ‐Axis Planar Boundaries in Cr 2 O 3 Thin Films-Reference-Cited by-同舟云学术

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Local Dielectric Breakdown Path along c ‐Axis Planar Boundaries in Cr 2 O 3 Thin Films

Published:2017-08-10 Issue:20 Volume:4 Page:1700172
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv. Mater. Interfaces

Author:

Sun Congli¹,Song Zhewen¹,Rath Ashutosh¹,Street Michael²,Echtenkamp William²,Feng Jie¹,Binek Christian²,Morgan Dane¹,Voyles Paul¹

Affiliation:

1. Department of Materials Science and Engineering University of Wisconsin‐Madison 1509 University Ave Madison WI 53706‐1595 USA

2. Department of Physics and Astronomy Nebraska Center for Materials and Nanoscience 855 North 16th Street Lincoln NE 68588‐0299 USA

Funder

Microelectronics Advanced Research Corporation

Defense Advanced Research Projects Agency

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/admi.201700172

Reference21 articles.

1. Magnetoelectric Switching of Exchange Bias

2. Robust isothermal electric control of exchange bias at room temperature

3. Magnetoelectric oxide films for spin manipulation in graphene

4. All-Electric Access to the Magnetic-Field-Invariant Magnetization of Antiferromagnets

5. Purely antiferromagnetic magnetoelectric random access memory

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1. Imaging Local Effects of Voltage and Boron Doping on Spin Reversal in Antiferromagnetic Magnetoelectric Cr₂O₃ Thin Films and Devices;Advanced Functional Materials;2024-08-02

2. On the origin of passive film breakdown and metastable pitting for stainless steel 316L;Corrosion Science;2024-04

3. Nanoscale imaging of antiferromagnetic domains in epitaxial films of Cr₂O₃via scanning diamond magnetic probe microscopy;RSC Advances;2023

4. Boron structure evolution in magnetic Cr2O3 thin films;Materials Today Physics;2022-10

5. Defect Nanostructure and its Impact on Magnetism of α ‐Cr ₂ O ₃ Thin Films;Small;2022-03-28

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