Oxidation of Crystalline Rubrene Films: Evidence of an Epitaxial Native Oxide Layer-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Oxidation of Crystalline Rubrene Films: Evidence of an Epitaxial Native Oxide Layer

Published:2017-09-29 Issue:23 Volume:4 Page:1700670
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv. Mater. Interfaces

Author:

Raimondo Luisa¹,Trabattoni Silvia¹,Moret Massimo¹,Masciocchi Norberto²,Masino Matteo³,Sassella Adele¹^ORCID

Affiliation:

1. Department of Materials Science; University of Milano Bicocca; via Cozzi 55 I-20125 Milano Italy

2. Department of Science and High Technology and ToScaLab; University of Insubria and INSTM; via Valleggio 11 I-22100 Como Italy

3. Department of Chemistry; Life Science and Environmental Sustainability; University of Parma; parco Area delle Scienze 17/a I-43124 Parma Italy

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Reference60 articles.

1. Intrinsic Charge Transport on the Surface of Organic Semiconductors

2. Observation of long-range exciton diffusion in highly ordered organic semiconductors

3. Fabrication of Highly Oriented Rubrene Thin Films by the Use of Atomically Finished Substrate and Pentacene Buffer Layer

4. High mobility organic thin film transistors based on monocrystalline rubrene films grown by low pressure hot wall deposition

5. Induced Crystallization of Rubrene in Thin-Film Transistors

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Tailoring the optical properties of rubrene films through epitaxy-induced amorphous-to-crystal transition;Journal of Materials Chemistry C;2024

2. Wettability‐Assisted Process to Shape Organic Crystalline Printed Films;Advanced Materials Interfaces;2022-09-06

3. Homoepitaxial growth of 9,10-diphenylanthracene;Journal of Crystal Growth;2020-09

4. Control of post-growth processes for the selection of metallo-tetraphenylporphyrin nanowires;Physical Chemistry Chemical Physics;2019

5. Local anodic oxidation lithography on organic semiconductor crystals: Oxide depth revealed by conductance tomography;Organic Electronics;2018-12

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3