Combined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin Films-Reference-Cited by-同舟云学术

Combined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin Films

Published:2015-06-01 Issue:10 Volume:2 Page:1500181
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv. Mater. Interfaces

Author:

Jones Jacob L.¹,LeBeau James M.¹,Nikkel Jason¹,Oni Adedapo A.¹,Dycus J. Houston¹,Cozzan Clayton²,Lin Fang-Yin²,Chernatynskiy Aleksandr²,Nino Juan C.²,Sinnott Susan B.²,Mhin Sungwook³,Brennecka Geoff L.⁴,Ihlefeld Jon⁵

Affiliation:

1. Department of Materials Science and Engineering; North Carolina State University; Raleigh NC 27695 USA

2. Department of Materials Science and Engineering; University of Florida; Gainesville FL 32611 USA

3. Heat Treatment Technology R&BD Group; Korea Institute of Industrial Technology (KITECH); 406-840 Incheon Republic of Korea

4. Department of Metallurgical and Materials Engineering; Colorado School of Mines; Golden CO 80401 USA

5. Electronic, Optical, and Nanostructured Materials Department; Sandia National Laboratories; Albuquerque NM 87185-1411 USA

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Reference48 articles.

1. A Ferroelectric Oxide Made Directly on Silicon

2. Atomic scale structure and chemistry of Bi2Te3/GaAs interfaces grown by metallorganic van der Waals epitaxy

3. Chemically Homogeneous Complex Oxide Thin Films Via Improved Substrate Metallization

4. Phase and texture evolution in solution deposited lead zirconate titanate thin films: Formation and role of the Pt3Pb intermetallic phase

5. Importance Of Solution Chemistry In Preparing Sol–Gel PZT Thin Films Directly On Copper Surfaces

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