Measuring Graphene Adhesion on Silicon Substrate by Single and Dual Nanoparticle-Loaded Blister-Reference-Cited by-同舟云学术

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Measuring Graphene Adhesion on Silicon Substrate by Single and Dual Nanoparticle-Loaded Blister

Published:2017-02-13 Issue:9 Volume:4 Page:1601023
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv. Mater. Interfaces

Author:

Gao Xiangyang¹,Yu Xiyu¹,Li Buxuan²,Fan Shangchun¹,Li Cheng¹³

Affiliation:

1. School of Instrumentation Science and Opto-Electronics Engineering; Beihang University; Beijing 100191 China

2. School of Aerospace Engineering; Tsinghua University; Beijing 100084 China

3. Department of Mechanical Engineering; University of California; Berkeley CA 94720 USA

Funder

National Natural Science Foundation of China

Aviation Science Foundation of China

Graduate Innovation Fund of Beihang University

China Scholarship Council

Changjiang Scholars and Innovative Research Team in University

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Reference37 articles.

1. 2D materials: to graphene and beyond

2. Electric Field Effect in Atomically Thin Carbon Films

3. Measurement of the Elastic Properties and Intrinsic Strength of Monolayer Graphene

4. Electromechanical Resonators from Graphene Sheets

5. Impermeable Atomic Membranes from Graphene Sheets

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3. Reduction of Interlayer Interaction in Multilayer Stacking Graphene with Carbon Nanotube Insertion: Insights from Experiment and Simulation;The Journal of Physical Chemistry C;2023-12-01

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