Measurement of thin film composites using microstrip line fixtures-Reference-Cited by-同舟云学术

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Measurement of thin film composites using microstrip line fixtures

Published:2014-06-24 Issue:9 Volume:56 Page:2071-2074
ISSN:0895-2477
Container-title:Microwave and Optical Technology Letters
language:en
Short-container-title:Microw. Opt. Technol. Lett.

Author:

Nguyen Phuong Minh¹²,Chung Jae-Young¹²

Affiliation:

1. Department of Electrical and Information Engineering; Seoul National University of Science and Technology; 232 Gongneung-ro, Nowon-gu Seoul 139-743 Korea

2. Convergence Institute of Biomedical Engineering and Biomaterials, Seoul National University of Science and Technology; 232 Gongneung-ro, Nowon-gu Seoul 139-743 Korea

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Flexible electronics: The next ubiquitous platform;Nathan;Proc IEEE,2012

2. Improved technique for determining complex permittivity with the transmission/reflection method;Baker-Jarvis;IEEE Trans Microwave Theory Tech,1990

3. Automatic measurement of complex dielectric constant and permeability at microwave frequencies;Weir;Proc IEEE,1974

4. A new strip line broad-band measurement evaluation for determining the complex permeability of thin ferromagnetic films;Bekker;J Magn Magn Mater,2004

5. An improved permeameter for thin film measurements up to 6 ghz;Pain;J Appl Phys,1999

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