Performance of customized control charts to detect process disturbances-Reference-Cited by-同舟云学术

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Performance of customized control charts to detect process disturbances

Published:2001 Issue:3 Volume:17 Page:205-218
ISSN:0748-8017
Container-title:Quality and Reliability Engineering International
language:en
Short-container-title:Qual. Reliab. Engng. Int.

Author:

Heredia-Langner Alejandro,Montgomery Douglas C.,Runger George C.,Borror Connie M.,Post Richard I.

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Reference10 articles.

1. Run-to-run control charts with contrasts

2. Virgin versus recycled wafers for furnace qualification: is the expense justified? Statistical Case Studies for Industrial Process Improvement. (eds.). Society for Industrial and Applied Mathematics: Philadelphia, PA, 1997.

3. Introduction to Statistical Quality Control (3rd edn). John Wiley and Sons: New York, 1996.

4. Multivariate and multiple stream process control. PhD Dissertation, Arizona State University, 1999.

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Using expert technology to select unstable slicing machine to control wafer slicing quality via fuzzy AHP;Expert Systems with Applications;2008-04

2. The worst ill-conditioned silicon wafer slicing machine detected by using grey relational analysis;The International Journal of Advanced Manufacturing Technology;2006-10-10

3. On Monitoring Processes and Assessing Process Capability under a Hierarchical Model, Part 1;Frontiers in Statistical Quality Control 7;2004

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