Designing two mixed quick switching sampling plans for linear profiles

Abstract

AbstractThis study compares two proposed mixed quick switching sampling (QSS) plans for linear profiles as the quality characteristic. For the QSS plans, we recommend a binomial attribute plan for normal inspection and then a variable sampling plan for tightened inspection based on capability index CpuA of linear profiles with one‐sided specifications. The difference between the two proposed QSS plans is in the tightened inspection. Tightened inspection of the first proposed plan is a single sampling using CpuA index, but tightened inspection of the second plan is a multiple dependent state repetitive (MDSR) plan based on CpuA index. The optimal parameters are obtained by nonlinear optimization. Simulation study for selecting parameters is conducted with various combinations of specified acceptable quality level (AQL), limited quality level (LQL), producer's risk, and consumer's risk. Simulation results confirm that the second proposed QSS plan which applies variable MDSR at tightened inspection performs better than another proposed plan. Hence, the approach of the second proposed plan is demonstrated in an illustrative example.