An analysis on malfunction of a flip-flop due to impulsive noise on power supply-Reference-Cited by-同舟云学术

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An analysis on malfunction of a flip-flop due to impulsive noise on power supply

Published:2003-09-10 Issue:10 Volume:86 Page:36-50
ISSN:8756-663X
Container-title:Electronics and Communications in Japan (Part II: Electronics)
language:en
Short-container-title:Electron. Comm. Jpn. Pt. II

Author:

Tsukagoshi Tsuneo,Nitta Shuichi,Mutoh Atsuo

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,General Physics and Astronomy

Reference17 articles.

1. Control equipment noise and countermeasures. IEEJ Technical Reports, Section II, No. 123, 1979.

2. Malfunction-mode of digital circuit due to noise. 1992 Int Symp EMC, Beijing, p 605-608.

3. EMI-induced delays in digital circuits: Application. Int EMC Symp Rec Anaheim, CA, p 449-454, 1992.

4. EMI-induced delays in digital circuits: Application. Int EMC Symp Rec, Anaheim, CA, p 443-448, 1992.

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