Optimal Design for Step-Stress Accelerated Test with Random Discrete Stress Elevating Times Based on Gamma Degradation Process-Reference-Cited by-同舟云学术

Optimal Design for Step-Stress Accelerated Test with Random Discrete Stress Elevating Times Based on Gamma Degradation Process

Published:2015-12-11 Issue:7 Volume:32 Page:2391-2402
ISSN:0748-8017
Container-title:Quality and Reliability Engineering International
language:en
Short-container-title:Qual. Reliab. Engng. Int.

Author:

Amini Morteza¹,Shemehsavar Soudabeh¹,Pan Zhengqiang²

Affiliation:

1. Department of Statistics, School of Mathematics, Statistics and Computer Science, College of Science; University of Tehran; P.O. Box 14155-6455 Tehran Iran

2. Department of Systems Engineering, College of Information Systems and Management; National University of Defense Technology; Changsha China

Funder

Iran National Science Foundation

National Science Foundation of China

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/qre.1943/fullpdf

Reference19 articles.

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2. Designing a degradation experiment;Yu;Naval Research Logistics,1999

3. Lifetime distribution based degradation analysis;Chen;IEEE Transactions on Reliability,2005

4. An alternative degradation reliability modeling approach using maximum likelihood estimation;Huang;IEEE Transactions on Reliability,2005

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