Degradation of interfacial adhesion strength within photovoltaic mini-modules during damp-heat exposure

Author:

Wu Dan1,Zhu Jiang1,Betts Thomas R.1,Gottschalg Ralph1

Affiliation:

1. Centre for Renewable Energy Systems Technology (CREST), School of Electronic, Electrical and Systems Engineering; Loughborough University; Loughborough Leicestershire LE11 3TU UK

Funder

Engineering and Physical Sciences Research Council

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference34 articles.

1. Quintana MA King DL McMahon TJ Osterwald CR Commonly observed degradation in field-aged photovoltaic modules 29th IEEE PVSEC 2002

2. Pern J. Module encapsulation materials, processing and testing APP International PV Reliability Workshop 2008

3. Analysis of leakage currents in photovoltaic modules under high-voltage bias in the field;Cueto;Progress in Photovoltaics: Research and Applications,2002

4. Analysis of degradation mechanisms of crystalline silicon PV modules after 12 years of operation in Southern Europe;Sanchez-Friera;Progress in Photovoltaics: Research and Applications,2011

5. Polycrystalline silicon PV modules performance and degradation over 20 years;Polverini;Progress in Photovoltaics: Research and Applications,2012

Cited by 44 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3