Extraction of an avalanche diode noise model for its application as an on-wafer noise source

Author:

Maya M. C.,Lázaro A.,Pradell L.

Funder

Spanish Government

CONACYT-Mexico

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Characterization and applications of on-wafer diode noise;Dunleavy;IEEE Trans Microwave Theory Techn,1998

2. A novel on-wafer resistive source;Béland;IEEE Microwave Guided Wave Lett,1999

3. Cold-FET ENR characterization applied to the measurement on-wafer transistor noise parameters;Maya;Euro Microwave Conf,2002

4. Extraction of noise parameters of transistor using a spectrum analyser and 50 Ω noise figure measurements only;Lázaro;IEE Electron Lett,1998

5. Electronic tuning effects in the read microwave avalanche diode;Gilden;IEEE Trans Electron Devices,1966

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