P‐195: Analysis of Impurities in OLED Materials-Reference-Cited by-同舟云学术

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P‐195: Analysis of Impurities in OLED Materials

Published:2024-06 Issue:1 Volume:55 Page:2131-2133
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:Symp Digest of Tech Papers

Author:

Takano Hikaru¹,Shirakura Daichi¹,Fujimoto Hiroshi²³,Adachi Chihaya²³

Affiliation:

1. Toray Research Center, Inc. Shiga Japan

2. Fukuoka i³‐Center for Organic Photonics and Electronics Research (i³‐opera) Fukuoka Japan

3. Center for Organic Photonics and Electronics Research (OPERA), Kyushu University Fukuoka Japan

Abstract

We conducted combustion ion chromatography, TOFSIMS, and LC/MS measurements to identify impurities in OLED materials affecting device lifetime decreases. The results of various analyses indicated that the synthesis lot with a low device lifetime contained a significant amount of brominated Host‐1 (Host‐1‐Br), and we successfully identified the compound responsible for the degradation of the device lifetime.

Publisher

Wiley

Reference6 articles.

1. Residual Halide Groups in Gilch-Polymerized Poly(p-phenylene-vinylene) and Their Impact on Performance and Lifetime of Organic Light-Emitting Diodes

2. Influence of vacuum chamber impurities on the lifetime of organic light-emitting diodes

3. Influence of material impurities in the hole-blocking layer on the lifetime of organic light-emitting diodes;Fujimoto H;Applied Physics Letters,2016

4. Enhanced stability of organic light-emitting devices fabricated under ultra-high vacuum condition

5. 69‐3: Examination of Degradation Analysis of p‐i‐n Type OLEDs Devices

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