Affiliation:
1. Research & Development Division Japan Display Inc. Chiba Japan
Abstract
The Organic Light Emitting Diode (OLED) lifetime property was investigated in the lower current‐density region. The OLED display is required for an equivalent long lifetime performance in higher and lower current‐density regions. It was clarified that hole accumulation at the interface between electron blocking layer (EBL) and emissive layer (EML) is important for the Blue OLED lifetime property at lower current densities. The device simulation showed that the appropriate EML hole barrier affects the carrier distribution.