How to measure accurately mass transport in thin films by AES-Reference-Cited by-同舟云学术

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How to measure accurately mass transport in thin films by AES

Published:2002-08 Issue:1 Volume:34 Page:389-392
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Girardeaux C.,Clugnet G.,Erdélyi Z.,Nyéki J.,Bernardini J.,Beke D.,Rolland A.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference13 articles.

1. Surface science in metallurgy

2. Equilibrium segregation in a ternary solution: A model for temper embrittlement

3. Measurement of grain‐boundary diffusion at low temperatures by the surface accumulation method. I. Method and analysis

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thermodynamical Properties of Nanoalloys;Nanoalloys;2020

2. Thermodynamical properties of nanoalloys;Nanoalloys;2013

3. Equilibrium surface segregation enthalpy of Ge in concentrated amorphous SiGe alloys;Applied Surface Science;2003-05

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