Probing the Location and Speciation of Elements in Zeolites with Correlated Atom Probe Tomography and Scanning Transmission X‐Ray Microscopy-Reference-Cited by-同舟云学术

Probing the Location and Speciation of Elements in Zeolites with Correlated Atom Probe Tomography and Scanning Transmission X‐Ray Microscopy

Published:2018-10-31 Issue:1 Volume:11 Page:488-494
ISSN:1867-3880
Container-title:ChemCatChem
language:en
Short-container-title:ChemCatChem

Author:

Schmidt Joel E.¹^ORCID,Ye Xinwei¹²,van Ravenhorst Ilse K.¹,Oord Ramon¹^ORCID,Shapiro David A.³,Yu Young‐Sang³,Bare Simon R.⁴^ORCID,Meirer Florian¹^ORCID,Poplawsky Jonathan D.⁵^ORCID,Weckhuysen Bert M.¹^ORCID

Affiliation:

1. Debye Institute for Nanomaterials Science, Faculty of ScienceUtrecht University Utrecht 3584 CG Netherlands

2. School of Materials Science and Engineering Key Laboratory of Advanced Energy Materials Chemistry (MOE) Collaborative Innovation Center of Chemical Science and EngineeringNankai University Tianjin 300350 P.R. China

3. Advanced Light SourceLawrence Berkeley National Laboratory Berkeley CA 94720 USA

4. SLAC National Accelerator Laboratory Menlo Park CA 94025 USA

5. Center for Nanophase Materials SciencesOak Ridge National Laboratory Oak Ridge TN 37831 USA

Funder

European Research Council

Publisher

Wiley

Subject

Inorganic Chemistry,Organic Chemistry,Physical and Theoretical Chemistry,Catalysis

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/cctc.201801378

Reference55 articles.