How multiple scattering simulations help for EELS compositional analysis of hard metals and ceramics-Reference-Cited by-同舟云学术

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How multiple scattering simulations help for EELS compositional analysis of hard metals and ceramics

Published:2016-12-20 Issue: Volume: Page:817-818
ISSN:
Container-title:European Microscopy Congress 2016: Proceedings
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Author:

Konrad Lukas¹,Lattemann Martina²,Rehr John³,Kolb Ute⁴,Haishuang Zhao⁴,Kothleitner Gerald¹

Affiliation:

1. Graz Centre for Electron Microscopy & Institute for Electron Microscopy and Nanoanalysis; Graz University of Technology; Graz Autriche

2. Coromant R&D Materials and Processes; AB Sandvik Coromant; Stockholm Suède

3. Department of Physics; University of Washington; Washington Etats-Unis

4. Institute of Inorganic Chemistry and Analytical Chemistry; Johannes Gutenberg-University; Mainz Allemagne

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Reference7 articles.

1. Parameter-free calculations of X-ray spectra with FEFF9

2. R.F. Egerton EELS in the Electron Microscope 3 Springer 2011

3. Atomic Screening Constants from SCF Functions

4. Improvement of the hydrogenic model to give more accurate values of K-shell ionization cross sections

5. Towards automated diffraction tomography: Part I—Data acquisition

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