Revisiting the EELS analyses and its coupling with multi-wavelength Raman spectroscopy: the case of hydrogenated amorphous carbon thin films-Reference-Cited by-同舟云学术

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Revisiting the EELS analyses and its coupling with multi-wavelength Raman spectroscopy: the case of hydrogenated amorphous carbon thin films

Published:2016-12-20 Issue: Volume: Page:744-745
ISSN:
Container-title:European Microscopy Congress 2016: Proceedings
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Author:

Lajaunie Luc¹,Pardanaud Cédric²,Martin Céline²,Pascal Puech³,Hu Cheng⁴⁵,Biggs Mark James⁴⁵,Arenal Raul¹⁶

Affiliation:

1. Laboratorio de Microscopías Avanzadas; Instituto de Nanociencia de Aragón, Universidad de Zaragoza; Zaragoza Espagne

2. PIIM; Aix-Marseille Université-CNRS; Marseille France

3. CEMES; CNRS; Toulouse France

4. The University of Adelaide; School of Chemical Engineering; Adelaide Australie

5. School of Science; Loughborough University; Loughborough Royaume Uni

6. ARAID; Foundation; Zaragoza Espagne

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Reference8 articles.

1. Probing the tribochemical degradation of hydrogenated amorphous carbon using mechanically stimulated gas emission spectroscopy

2. Density,sp3fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy

3. Anisotropic relativistic cross sections for inelastic electron scattering, and the magic angle

4. A methodology to optimize the quantification of sp2 carbon fraction from K edge EELS spectra

5. Technique for the sp2∕sp3 characterization of carbon materials: Ab initio calculation of near-edge structure in electron-energy-loss spectra

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