Experimental Determination of the Solid Angle of EDXS Detectors-Reference-Cited by-同舟云学术

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Experimental Determination of the Solid Angle of EDXS Detectors

Published:2016-12-20 Issue: Volume: Page:943-944
ISSN:
Container-title:European Microscopy Congress 2016: Proceedings
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Author:

Lammer Judith¹²,Kraxner Johanna²,Grogger Werner¹²

Affiliation:

1. FELMI; Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology; Graz Autriche

2. ZFE; Graz Centre for Electron Microscopy; Graz Autriche

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Reference9 articles.

1. Analytical Formulae for Calculation of X-Ray Detector Solid Angles in the Scanning and Scanning/Transmission Analytical Electron Microscope

2. Analytical solution for the solid angle subtended at any point by an ellipse via a point source radiation vector potential

3. Characterization of an analytical electron microscope with a NiO test specimen

4. Cross Sections for Inner-Shell Ionization by Electron Impact

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