Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films-Reference-Cited by-同舟云学术

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Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films

Published:2011-10-05 Issue:6 Volume:40 Page:427-431
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Ufuktepe Y.¹,Akgül G.²,Aksoy F.³,Nordlund D.⁴

Affiliation:

1. Physics Department; University of Cukurova; 01330; Adana; Turkey

2. Bor Vocational School; University of Nigde; 51240; Nigde; Turkey

3. Physics Department; University of Nigde; 51100; Nigde; Turkey

4. Stanford Synchrotron Radiation Laboratory; 2575 Sand Hill Road; MenloPark; CA 94025; USA

Publisher

Wiley

Subject

Spectroscopy

Reference28 articles.

1. Unoccupied Electronic States

2. NEXAFS Spectroscopy

3. Absolute helicity-dependent photoabsorption cross sections of Fe thin films and quantitative evaluation of magnetic-moment determination;Chakarian;Phys. Rev. B,1998

4. The 2p absorption spectra of 3d transition metal compounds in tetrahedral and octahedral symmetry;Van der Laan;J. Phys. Condens. Matter,1992

5. Anomalous L3/L2 White-Line Ratios in the 3d Transition Metals;Leapman;Phys. Rev. Lett.,1980

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