Real divisors and pseudo‐continuous enhancement of resolution for a Kendrick mass defect analysis
Author:
Affiliation:
1. Research Institute for Sustainable ChemistryNational Institute of Advanced Industrial Science and Technology (AIST) Tsukuba Ibaraki Japan
2. JEOL USA Inc. Peabody MA USA
Publisher
Wiley
Subject
Organic Chemistry,Spectroscopy,Analytical Chemistry
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/rcm.8500
Reference15 articles.
1. Structural Characterization of Polymers by MALDI Spiral-TOF Mass Spectrometry Combined with Kendrick Mass Defect Analysis
2. Quantities, Units and Symbols in Physical Chemistry
3. On the Kendrick Mass Defect Plots of Multiply Charged Polymer Ions: Splits, Misalignments, and How to Correct Them
4. A Mass Scale Based on CH2 = 14.0000 for High Resolution Mass Spectrometry of Organic Compounds.
5. Extension of the Kendrick Mass Defect Analysis of Homopolymers to Low Resolution and High Mass Range Mass Spectra Using Fractional Base Units
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1. Mass Defect Filter for Removing Noise and Detector Oscillation Artifacts in Centroided Time-of-Flight Mass Spectra;Journal of the American Society for Mass Spectrometry;2022-02-11
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3. Molecular characterization of polyethylene oxide based oligomers by surface‐assisted laser desorption/ionization mass spectrometry using a through‐hole alumina membrane as active substrate;Rapid Communications in Mass Spectrometry;2020-02-08
4. An arsenal of tools based on Kendrick mass defects to process congested electrospray ionization high‐resolution mass spectra of polymers with multiple charging;Rapid Communications in Mass Spectrometry;2020-02-08
5. The Kendrick analysis for polymer mass spectrometry;Journal of Mass Spectrometry;2019-12
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