Local Structure Measurement Around Light Elements by Using Inverse Photoelectron Holography

Author:

Yamamoto Yuta1,Kimura Koji1,Ang Artoni K. R.1ORCID,Matsushita Tomohiro2,Hayashi Kouichi13

Affiliation:

1. Department of Physical Science and Engineering; Nagoya Institute of Technology; Gokiso, Showa, Nagoya Aichi 466-8555 Japan

2. Japan Synchrotron Radiation Research Institute(JASRI); SPring-8, 1-1-1 Kouto, Sayo-cho Sayo-gun Hyogo 679-5198 Japan

3. Frontier Research Institute for Materials Science; Nagoya Institute of Technology; Gokiso, Showa Nagoya Aichi 466-8555 Japan

Funder

Japan Society for the Promotion of Science

Grant-in-Aid for Scientific Research on Innovative Areas “3D Active-Site Science“

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Atomic-Resolution Holography;The Materials Research Society Series;2023-10-26

2. 最前線の局所構造解析の研究を通しての経験;Materia Japan;2022-07-01

3. X-ray Fluorescence Holography Measurement of Oxynitride Thin Film of CaTaO2N;e-Journal of Surface Science and Nanotechnology;2021-10-16

4. Anion arrangement analysis of oxynitride perovskite thin film with inverse photoelectron holography;Journal of Electron Spectroscopy and Related Phenomena;2021-01

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