Quantification of impurity concentration in Cu2O and CuO via secondary ion mass spectrometry-Reference-Cited by-同舟云学术

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Quantification of impurity concentration in Cu2O and CuO via secondary ion mass spectrometry

Published:2011-12-15 Issue:4 Volume:249 Page:801-811
ISSN:0370-1972
Container-title:physica status solidi (b)
language:en
Short-container-title:Phys. Status Solidi B

Author:

Laufer Andreas,Reppin Daniel,Metelmann Hauke,Geburt Sebastian,Ronning Carsten,Leichtweiss Thomas,Janek Jürgen,Meyer Bruno K.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference34 articles.

1. O. Madelung Semiconductors: Data Handbook third ed Springer Berlin/Heidelberg 2004

2. Optical Properties of Cu2O Studied by Spectroscopic Ellipsometry

3. Optical Properties of CuO Studied by Spectroscopic Ellipsometry

4. Fabrication of the CuO/Cu2O heterojunction using an electrodeposition technique for solar cell applications

5. Thin film deposition of Cu2O and application for solar cells

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