Micro reflectance difference techniques: Optical probes for surface exploration-Reference-Cited by-同舟云学术

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Micro reflectance difference techniques: Optical probes for surface exploration

Published:2012-02-21 Issue:6 Volume:249 Page:1119-1123
ISSN:0370-1972
Container-title:physica status solidi (b)
language:en
Short-container-title:Phys. Status Solidi B

Author:

Lastras-Martínez L. F.,del Pozo-Zamudio O.,Herrera-Jasso R.,Ulloa-Castillo N.A.,Balderas-Navarro R.E.,Ortega-Gallegos J.,Lastras-Martínez A.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference35 articles.

1. Reflection anisotropy spectroscopy

2. Anisotropies in the Above—Band-Gap Optical Spectra of Cubic Semiconductors

3. In-plane optical anisotropy in GaAsN/GaAs single-quantum well investigated by reflectance-difference spectroscopy

4. Analysis of reflectometers for surface anisotropy

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1. Investigation of Reflection Anisotropy Induced by Micropipe Defects on the Surface of 4H-SiC Single Crystal Using Scanning Anisotropy Microscopy;Chinese Physics B;2023-08-22

2. Multi‐Material Strain Mapping with Scanning Reflectance Anisotropy Microscopy;Advanced Functional Materials;2023-06-30

3. Rapid reflectance difference microscopy based on liquid crystal variable retarder;Journal of Vacuum Science & Technology B;2019-09

4. Influence of numerical aperture (NA) on micro-reflectance spectroscopy;Photonic Instrumentation Engineering VI;2019-03-04

5. Investigation of InGaN Layer Grown Under In-Rich Condition by Reflectance Difference Spectroscopy Microscope;Journal of Nanoscience and Nanotechnology;2018-11-01

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