Structural and Electronic Properties of Defect-Free and Defect-Containing Polypropylene: A Computational Study by van der Waals Density-Functional Method-Reference-Cited by-同舟云学术

Structural and Electronic Properties of Defect-Free and Defect-Containing Polypropylene: A Computational Study by van der Waals Density-Functional Method

Published:2017-10-04 Issue:3 Volume:255 Page:1700036
ISSN:0370-1972
Container-title:physica status solidi (b)
language:en
Short-container-title:Phys. Status Solidi B

Author:

Nguyen Huy-Viet¹²,Pham Thinh H.³

Affiliation:

1. Institute of Research and Development, Duy Tan University; K7/25 Quang Trung Danang Vietnam

2. Institute of Physics, Vietnam Academy of Science and Technology; 18 Hoang Quoc Viet, Cau Giay Hanoi Vietnam

3. School of Electrical Engineering, Hanoi University of Science and Technology; 1 Dai Co Viet, Hai Ba Trung Hanoi Vietnam

Funder

National Foundation for Science and Technology Development

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Effect of Alteration of Antioxidant by UV Treatment on the Dielectric Strength of BOPP Capacitor Film

2. Advanced polymeric dielectrics for high energy density applications

3. The influence of morphology on the electrical breakdown strength of polypropylene film

4. Electrical Degradation and Breakdown in Polymers

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3. Defects caused by degradation – A stumbling block for nanocomposites in thin film capacitors;2022 IEEE 4th International Conference on Dielectrics (ICD);2022-07-03

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