Hidden information in principal component analysis of ToF-SIMS data: On the use of correlation loadings for the identification of significant signals and structure elucidation-Reference-Cited by-同舟云学术

Hidden information in principal component analysis of ToF-SIMS data: On the use of correlation loadings for the identification of significant signals and structure elucidation

Published:2017-08-01 Issue:10 Volume:49 Page:1028-1038
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Heller Danica¹²^ORCID,ter Veen Rik¹,Hagenhoff Birgit¹,Engelhard Carsten²^ORCID

Affiliation:

1. Tascon GmbH; Mendelstraße 17 48149 Münster Germany

2. Department of Chemistry and Biology; University of Siegen; Adolf-Reichwein-Straße 2 57076 Siegen Germany

Funder

Federal Goverment of North Rhine-Westphalia & Europäiasche Fonds für regionale Entwicklung

Bundesministerium für Bildung und Forschung

NanoBioDetect

OptiLIB

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference40 articles.

1. Characterisation of biological material with ToF-SIMS: a review;Fearn;Mat Sci Technol,2015

2. Unexpected materials in a Rembrandt painting characterized by high spatial resolution cluster-TOF-SIMS imaging;Sanyova;Anal. Chem.,2011

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