63-2: A Novel Touch-control Method with Partial Scanning for LC, OLED, and Hybrid Displays using an Oxide Semiconductor
Author:
Affiliation:
1. Semiconductor Energy Laboratory Co. Ltd.; Kanagawa Japan
2. Semiconductor Energy Laboratory Co. Ltd.; Tochigi Japan
Publisher
Wiley
Reference12 articles.
1. Low Power LC Display Using In-Ga-Zn-Oxide TFTs Based on Variable Frame Frequency;Amano;SID Symp. Dig. Tech. Pap.,2010
2. Low Power LC Display Using In-Ga-Zn-Oxide TFTs Based on Variable Frame Frequency and Partial Scan,;Harada;Proc. AM-FPD’10 Dig.,2010
3. Research, Development, and Application of Crystalline Oxide Semiconductor;Yamazaki;SID Symp. Digest,2012
4. Back-channel-etched thin-film transistor using c-axis-aligned crystal In-Ga-Zn oxide;Yamazaki;Journal of SID,2014
5. Future Possibility of C-Axis Aligned Crystalline Oxide Semiconductors Comparison with Low-Temperature Polysilicon;Yamazaki;SID Symp. Dig. Tech.,2014
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