Evaluation of the measurement accuracy and uncertainty of a solid‐state detector under diagnostic x‐ray beam conditions

Abstract

AbstractObjectiveAn accurate measurement of x‐ray beams is expected to reduce the uncertainties associated with estimating radiation risk to patients in clinical settings. To perform assessment tasks based on the readings of a solid‐state detector (SSD) using semiconductor technology, the characteristics of the detector should be elucidated. In this study, we evaluated the measurement accuracy of a new SSD under diagnostic x‐ray beam conditions in terms of air kerma, tube voltage, and half‐value layer (HVL). The performance of the SSD was then compared with those of reference instruments.MethodsThe tube voltage was varied within the range of 50–120 kV in steps of 10 kV and the thickness and materials of additional filters were concurrently changed (several combinations were tested). In addition, the dose rate and energy dependence of the SSD were also investigated. These effects were analyzed based on statistical significance tests. Furthermore, the expanded uncertainties in the series of measurements were meticulously calculated.ResultsThe results showed average relative differences of −3.26 ± 1.33%, 0.44 ± 1.01%, and −2.60 ± 3.31% for air kerma, tube voltage, and HVL, respectively. Furthermore, air kerma did not exhibit any dependence on dose rate and energy, in contrast to tube voltage and HVL measurements.ConclusionThe measurement values of the SSD fall within the acceptable range of uncertainty, highlighting its measurement accuracy and reliability. Furthermore, based on the characteristics elucidated by this study, valuable insights are provided concerning the assurance of appropriate measurement values in clinical settings.