Photoluminescence Spectroscopy of Cuprous Oxide: Bulk Crystal versus Crystalline Films

Author:

Soltanmohammadi Mina1,Spurio Eleonora2,Gloystein Alexander1,Luches Paola2ORCID,Nilius Niklas1ORCID

Affiliation:

1. Institut für Physik Carl von Ossietzky Universität D-26111 Oldenburg Germany

2. CNR Istituto Nanoscienze Via G. Campi 213/a 41125 Modena Italy

Abstract

Cuprous oxide (Cu2O) crystals and films of 10–65 nm thickness are investigated via electron diffraction, scanning tunneling microscopy (STM), and photoluminescence (PL) spectroscopy at temperature between 100 to 300 K. While the chemical composition and surface morphology of both systems are identical, large differences are found in the optical response. Bulk Cu2O shows pronounced PL peaks at 620, 730, and 920 nm, compatible with the radiative decay of free and bound excitons, whereas broad and asymmetric peaks at 775 and 850 nm are found for Cu2O films grown on Au(111) and Pt(111) supports. The latter represent the PL signature of VO2+ and VO+ defects, being inserted with substrate‐dependent concentrations due to the oxygen‐poor preparation of the Cu2O films. Despite the strong VO signature in PL, all Cu2O samples show p‐type conductance behavior in STM spectroscopy, indicating an abundance of Cu defects in the lattice. The fact that O vacancies still govern the thin‐film PL is explained by a more efficient recombination via VO‐ than Vcu‐emission channels, as the latter requires exciton formation first. Herein, the high sensitivity of low‐temperature PL to probe the defect landscape of dielectrics, being neither reached by photoelectron spectroscopy nor scanning probe techniques is demonstrated.

Funder

Deutsche Forschungsgemeinschaft

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3