Implementation of Nanoscale Secondary‐Ion Mass Spectrometry Analyses: Application to Ni‐Based Superalloys-Reference-Cited by-同舟云学术

Implementation of Nanoscale Secondary‐Ion Mass Spectrometry Analyses: Application to Ni‐Based Superalloys

Published:2021-12-20 Issue: Volume: Page:2100414
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Physica Status Solidi (a)

Author:

Almoric Jean¹²^ORCID,Durand Malik³,Seret Anthony³,Nicolaÿ Alexis³,Houel Arnaud²,Berbezier Isabelle¹,Bozzolo Nathalie³

Affiliation:

1. Department Elaboration et MOdélisation pour les NAnotechnologies (EMONA) Institut Matériaux Microélectronique Nanoscience de Provence (IM2NP) 13397 Marseille France

2. Orsay Physics 13710 Fuveau France

3. Department Métallurgie, Microstructure, Rhéologie MINES ParisTech - Centre de Mise en Forme des Matériaux (CEMEF) 06904 Sophia-Antipolis France

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssa.202100414

Reference40 articles.

1. An atom probe for three-dimensional tomography

2. Combining Experiments and Atom Probe Tomography‐Informed Simulations on γ′ Precipitation Strengthening in the Polycrystalline Ni‐Base Superalloy A718Plus

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of High Throughput Microscope Mode Secondary Ion Mass Spectrometry Imaging;Journal of the American Society for Mass Spectrometry;2023-06-15

2. Review of Recent Advances in Gas-Assisted Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS);Materials;2023-03-03