Coating Silver Tree‐like Fractal Structure with Silica Layer for Inhibiting Chemical Reactions of Analytes in Surface‐Enhanced Raman Scattering

Author:

Watanabe Hiroya1,Hishii Yurin1,Kishimoto Kanna1,Nogami Kohei1,Ma Qingyuan2,Niki Tomoya3,Kotani Tomoki3,Kiwa Toshihiko3,Shoji Satoru2,Ohkubo Takahiro1,Kano Jun1,Takeyasu Nobuyuki1ORCID

Affiliation:

1. Graduate School of Natural Science and Technology Okayama University 3-1-1, Tsushimanaka Kita-ku Okayama 700-8530 Japan

2. Graduate School of Informatics and Engineering The University of Electro-Communications 1-5-1 Chofugaoka Chofu Tokyo 182-8585 Japan

3. Graduate School of Interdisciplinary Science and Engineering in Health Systems Okayama University 3-1-1 Tsushimanaka Kita-ku Okayama 700-8530 Japan

Abstract

Silica coating is performed onto silver tree‐like fractal structures, which are self‐grown in a solution, through a wet process using tetraethyl orthosilicate. Surface‐enhanced Raman scattering (SERS) of para‐aminothiophenol (p‐ATP) is measured on the silver tree‐like fractal structures with/without silica layer at the excitation wavelength of 532 nm. p‐ATP is chemically transformed into dimercaptoazobenzene (DMAB) on the non‐coated silver tree‐like fractal structures, where DMAB peaks are clearly observed, during the SERS measurements. The DMAB peaks decrease/disappear on the silica‐coated ones although the p‐ATP peaks are observed. In the results, it is indicated that the chemical transformation is inhibited on the silica‐coated ones. The sensitivity is decreased by half compared to the non‐coated silver tree‐like fractal structures, where the lower detection limit is estimated to be ≈2 × 10−5 mol L−1 for p‐ATP. The silica coating is advantageous for inhibiting chemical transformations of analytes, enabling identification/estimation of chemicals in unknown sample with SERS similarly to conventional Raman spectroscopy.

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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