Detection Limit of Phosphorus in Diamond by High Mass Resolution Secondary‐Ion Mass Spectrometry-Reference-Cited by-同舟云学术

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Detection Limit of Phosphorus in Diamond by High Mass Resolution Secondary‐Ion Mass Spectrometry

Published:2022-12-13 Issue:4 Volume:220 Page:2200324
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Physica Status Solidi (a)

Author:

Pinault-Thaury Marie-Amandine¹^ORCID,Jomard François¹

Affiliation:

1. Groupe d’Etude de la Matière Condensée (GEMaC-UMR8635) CNRS Université de Versailles Saint Quentin en Yvelines (UVSQ) Université Paris-Saclay, 45 av des Etats Unis 78035 Versailles Cedex France

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssa.202200324

Reference30 articles.

1. Ultraviolet Emission from a Diamond pn Junction

2. Charge collection distance measurements in single and polycrystalline CVD diamond

3. Single crystal diamond for electronic applications

4. The use of CVD diamond for high-power switching using electron beam exitation

5. High-Efficiency Excitonic Emission with Deep-Ultraviolet Light from (001)-Oriented Diamondp-i-nJunction

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Physicochemical Characterizations of Functionalized Carbon Nanostructures;Handbook of Functionalized Carbon Nanostructures;2023-10-25

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