Affiliation:
1. Department of Electronic and Communication Engineering Madan Mohan Malaviya University of Technology Gorakhpur 273010 India
2. Institute of Advanced Materials, IAAM Gammalkilsvägen 59053 Ulrika Sweden
3. Photonics and Photovoltaic Research Lab Department of Physics and Material Science Madan Mohan Malaviya University of Technology Gorakhpur 273010 India
Abstract
The most popular method to determine the sensitivity of surface plasmon resonance (SPR) sensors in the last couple of decades has been angular interrogation. The silver layer (Ag), a 2D layer of TiO2, and dielectric material layer such as silicon (Si) with heterostructure material graphene are all stacked in the proposed SPR sensor. To increase sensitivity of SPR sensor in the visible area, the device structure focuses on the Kretschmann configuration, by which a TiO2 sheet is sandwiched between silver and silicon sheets. The proposed device structure makes use of the operational wavelength of 633 nm. The numerical simulation has been performed in MATLAB software in this device structure. The simulation results show that an analyte of refractive indices ranges 1.345–1.350. A single layer of silicon 3 nm and TiO2 10 nm makes up the suggested SPR configuration, which increases the sensitivity to 281° RIU−1. Herein, it has also been computed the figure of merit, detection accuracy, limit of detection, full width at half maximum, and transverse magnetic electric field intensity. The biomedical and chemical fields have benefited from the proposed SPR sensor structure design.
Subject
Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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