Recent results on the use of model resolution functions for the deconvolution of depth profiling data
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference11 articles.
1. Use of model depth resolution functions for the deconvolution of depth profiling data
2. Remarks on computing the probability integral in one and two dimensions. In Proceedings of the 1st Berkeley Symposium on Mathematical Statistics, Berkeley, California, 1945; 63.
3. A Useful Approximation to the Normal Distribution Function, with Application to Simulation
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5. The bivariate normal integral
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