Micromorphology analysis of TiO 2 thin films by atomic force microscopy images: The influence of postannealing-Reference-Cited by-同舟云学术

Micromorphology analysis of TiO 2 thin films by atomic force microscopy images: The influence of postannealing

Published:2020-01-08 Issue:5 Volume:83 Page:457-463
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microsc Res Tech

Author:

Ţălu Ştefan¹^ORCID,Achour Amine²,Solaymani Shahram³^ORCID,Nikpasand Kimia⁴,Dalouji Vali⁵,Sari Amirhossein⁴,Rezaee Sahar⁶^ORCID,Nezafat Negin B.³

Affiliation:

1. Technical University of Cluj‐NapocaThe Directorate of Research, Development and Innovation Management (DMCDI), Constant in Daicoviciu St., no. 15, Cluj‐Napoca, 400020 Cluj county Romania

2. University of Namur, Research Centre in Physics of Matter and Radiation (PMR), LISE Laboratory B‐5000, Namur Belgium

3. School of Physics, Institute for Research in Fundamental Sciences (IPM), P.O. Box 19395‐5531 Tehran Iran

4. Department of Physics, Faculty of Sciences, Science and Research Branch, Islamic Azad University Tehran Iran

5. Department of Physics, Faculty of Science, Malayer University Malayer Iran

6. Department of Physics, Kermanshah BranchIslamic Azad University Kermanshah Iran

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jemt.23433

Reference27 articles.

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2. Fundamental scales of adhesion and area–scale fractal analysis

3. Nucleation and growth of self-assembled nanofibre-structured rutile (TiO2) particles via controlled forced hydrolysis of titanium tetrachloride solution

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