Acceleration Factors for Combined‐Accelerated Stress Testing of Photovoltaic Modules

Author:

Hacke Peter1ORCID,Owen-Bellini Michael1,Kempe Michael D.1,Sulas-Kern Dana B.1,Miller David C.1,Jankovec Marko2,Mitterhofer Stefan2,Topič Marko2,Spataru Sergiu3,Gambogi William4,Tanahashi Tadanori5

Affiliation:

1. Reliability and System Performance National Renewable Energy Laboratory Golden CO 80401 USA

2. Faculty of Engineering University of Ljubljana 1000 Ljubljana Slovenia

3. Department of Electrical and Photonics Engineering Technical University of Denmark 4000 Roskilde Denmark

4. Photovoltaics and Advanced Materials DuPont Central Research and Development Wilmington DE 19803 USA

5. Renewable Energy Research Center National Institute of Advanced Industrial Science and Technology (AIST) Koriyama 963-0298 Japan

Abstract

Combined‐accelerated stress testing (C‐AST) is developed to establish the durability of photovoltaic (PV) products, including for degradation modes that are not a priori known or examined in standardized tests. C‐AST aims to comprehensively represent the sample, stress factors, and their combinations using levels at the statistical tails of the natural environment. Acceleration factors for relevant climate sequences within the C‐AST cycle with respect to the Florida USA climate are estimated for selected degradation mechanisms. It is found that for degradation of the outer backsheet polymer layer, the acceleration factor of the tropical climate sequence (the longest of the climate sequences) is f (T, G) = 17.3 with ultraviolet photodegradation; for polyethylene terephthalate hydrolysis (backsheets), f (T, RH) = 426; for electrochemical corrosion (PV cell), f (I) = 14.1; and for PbSn solder fatigue fT, r (T)) = 17.3. Here, T is the module temperature, G is the broadband spectrum irradiance on the plane of array of the module, RH is the relative humidity on the module surface, I is the leakage current through the module packaging, and r(T), the number of temperature reversals. The methods discussed herein are generally applicable for evaluating acceleration factors in other accelerated test methods.

Funder

U.S. Department of Energy

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference54 articles.

1. A. R.Hoffman E. L.Miller DOE/JPL 1012-78/11 Jet Propulsion Laboratory Pasadena CA 1978.

2. S.Thayer inProceedings Annual Reliability and Maintainability Symposium 1976 no. NSYM: IEEE-Inst Electrical Electronics Engineers Inc New York NY pp.76–77.

3. A. R.Hoffman E. L.Miller Bias-Humidity Testing of Solar-Cell Modules Jet Propulsion Lab. Pasadena CA 1978.

4. J. H.Wohlgemuth M.Conway D. H.Meakin inConf. Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conf.-2000 (Cat. No. 0°CH37036) IEEE Anchorage AK2000 pp.1483–1486.

5. J.Berghold S.Koch S.Pingel S.Janke A.Ukar P.Grunow T.Shioda Reliability of Photovoltaic Cells Modules Components and Systems VIII International Society for Optics and Photonics2015 Vol.9563 p.95630A.

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