Lateral Resolved XPS, a new Key to Failure Analysis-Reference-Cited by-同舟云学术

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Lateral Resolved XPS, a new Key to Failure Analysis

Published:1995 Issue:3 Volume:7 Page:203-208
ISSN:0947-076X
Container-title:Vakuum in Forschung und Praxis
language:de
Short-container-title:Vakuum in Forschung und Praxis

Author:

Page Simon,Schmiedel Hans

Publisher

Wiley

Subject

Surfaces, Coatings and Films,Condensed Matter Physics

Reference5 articles.

1. “Imaging XPS: The Different Methods Explained”, Microscopy and Analysis, March 1992, p. 29

2. Practical polymer film characterisation using high performance XPS methods

3. European Specification 0 243 060 B1, 1987

4. , United States Patent 5, 286, 974, 1994

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative XPS imaging—new possibilities with the delay-line detector;Applied Surface Science;2005-09

2. Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy;Analytical Chemistry;1998-05-01

3. Surface Characterization;Analytical Chemistry;1997-06-01

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