Improvement of peak-to-background ratio in PIXE and XRF methods using thin Si-PIN detectors-Reference-Cited by-同舟云学术

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Improvement of peak-to-background ratio in PIXE and XRF methods using thin Si-PIN detectors

Published:2003 Issue:2 Volume:32 Page:93-105
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Karydas A. G.,Zarkadas Ch.,Kyriakis A.,Pantazis J.,Huber A.,Redus R.,Potiriadis C.,Paradellis T.

Publisher

Wiley

Subject

Spectroscopy

Reference23 articles.

1. PIXE: a Novel Technique for Elemental Analysis. Wiley: New York, 1988.

2. High-Energy PIXE using 68 MeV protons

3. Proton-induced monochromatie x-ray beams

4. Physics of Nuclei and Particles, vol. I. Academic Press: New York, 1969.

5. CONTINUOUS BACKGROUNDS IN PIXE

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